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Optical Beam NFP Measurement System

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Optical Beam Near Field Pattern Measurement System

  • Optical beam pattern measurement and analysis system in combination with NFP measurement optics & Optical Beam Analysis Module AP013. Best for beam pattern evaluation of various optical devices, modules, and components.
  • Optical beam NFP/beam profile observation and analysis of LD, fiber, waveguide and various optical devices
  • Evaluation, assembling adjustment of various optical modules
  • Depending on wavelength a high-resolution CCD image sensor or InGaAs high sensitivity image sensor

Please see System Components tab below for system details and specifications per component.
1. ISA071  high resolution CMOS image sensor 400nm - 1100nm wavelength range
    OR 
    ISA041H2  InGaAs high sensitivity image sensor 900nm - 1700nm wavelength range
2. Basic M-Scope type L optics
    OR
    Advanced M-Scope type S optics with OBJECTIVE LENS and optional Coaxial epi-illumination unit
3. NEUTRAL DENSITY FILTER
4. MANUAL STAGE  (XYZ, XYZ+θxθy, or Z-axis)
5. OPTICAL BEAM ANALYSIS MODULE

ACCESSORIES:
  OPTICAL LAUNCH OPTICS (on the incident side, not used for measurement) 
    M-Scope type G    Underfilled launch optical system
    M-Scope type ML  Mode-selective launch optical system

 
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