EF/EAF Measurement System

Encircled Flux / Encircled Angular Flux Measurement System

+Rapid measurement and evaluation system for EF (Encircled Flux) and EAF (Encircled Angular Flux) analysis of multi-mode optical fiber by NFP/FFP measurement optics & Optical Beam Analysis Module AP013
+Evaluation and analysis of Encircled Flux (EF) for GI-MMF, waveguide etc
+Evaluation and analysis of Encircled Angular Flux (EAF) for SI-MMF, POF and waveguide etc
+In acordance with IEC61280-1-4 and IEC61300-3053
+Depending on wavelength a high resolution CCD image sensor or InGaAs high sensitivity image sensor


Please see System components tab below for system details and specifications per component.


Synos provides unique optical beam analysis software that provides EF/EAF analysis function / Optometrics BA Standard EF analysis function. 
In addition to EF/EAF analysis and EF/EAF graph display function, it also has EF/EAF mask display function, with the ability to output and save calculated EF/EAF data as csv data.