EF (Encircled Flux) / EAF (Encircled Angular Flux) Measurement System

Quantity:
 
+Rapid measurement and evaluation system for EF (Encircled Flux) and EAF (Encircled Angular Flux) analysis of multi-mode optical fiber by NFP/FFP measurement optics & Optical Beam Analysis Module AP013
+Evaluation and analysis of Encircled Flux (EF) for GI-MMF, waveguide etc
+Evaluation and analysis of Encircled Angular Flux (EAF) for SI-MMF, POF and waveguide etc
+In acordance with IEC61280-1-4 and IEC61300-3053
+Depending on wavelength a high resolution CCD image sensor or InGaAs high sensitivity image sensor


Please see System components tab below for system details and specifications per component.


Synos provides unique optical beam analysis software that provides EF/EAF analysis function / Optometrics BA Standard EF analysis function. 
In addition to EF/EAF analysis and EF/EAF graph display function, it also has EF/EAF mask display function, with the ability to output and save calculated EF/EAF data as csv data.





 
1. ISA011  image sensor 400nm - 1100nm wavelength range
    OR 
    ISA041H2  image sensor 900nm - 1700nm wavelength range
2. Measurement type:
    EF
    Basic M-Scope type L optics
    OR
    Advanced M-Scope type S optics with OBJECTIVE LENS and optional Coaxial epi-illumination unit
    EAF 
    M-Scope type F optics
3. NEUTRAL DENSITY FILTER
4. MANUAL STAGE  (XYZ, XYZ+θxθy, or Z-axis)
5. OPTICAL BEAM ANALYSIS MODULE

ACCESSORIES:
  OPTICAL LAUNCH OPTICS (on the incident side, not used for measurement) 
    M-Scope type G    Underfilled launch optical system
    M-Scope type ML  Mode-selective launch optical system

  MEASUREMENT LIGHT SOURCE UNIT
    LSS002/850   High power, low coherent, high stability 850nm SLD light source 
    LSL001 series  FC connector output high stability LD light source
    LSL011 series  SMF output LD light source unit

Product Files