Optical Beam NFP Measurement System

Quantity:
 

Optical Beam Near Field Pattern Measurement System

  • Optical beam pattern measurement and analysis system in combination with NFP measurement optics & Optical Beam Analysis Module AP013. Best for beam pattern evaluation of various optical devices, modules, and components.
  • Optical beam NFP/beam profile observation and analysis of LD, fiber, waveguide and various optical devices
  • Evaluation, assembling adjustment of various optical modules
  • Depending on wavelength a high-resolution CCD image sensor or InGaAs high sensitivity image sensor
  • Standard up to 300mW power, high power 1-10W
  • beam size ~0.05 - 1mm diameter

 

1. ISA071  high resolution CMOS image sensor 400nm - 1100nm wavelength range
    OR 
    ISA041H2  InGaAs high sensitivity image sensor 900nm - 1700nm wavelength range
2. Basic M-Scope type L optics
    OR
    Advanced M-Scope type S optics with OBJECTIVE LENS and optional Coaxial epi-illumination unit
    OR
    Basic high power 1-10W M-Scope type HL optics
    OR
    Advanced high power 1-10W M-Scope type HS optics with OBJECTIVE LENS and optional Coaxial epi-illumination unit
3. NEUTRAL DENSITY FILTER
4. MANUAL STAGE  (XYZ, XYZ+θxθy, or Z-axis)
5. OPTICAL BEAM ANALYSIS MODULE

ACCESSORIES:
  OPTICAL LAUNCH OPTICS (on the incident side, not used for measurement) 
    M-Scope type G    Underfilled launch optical system
    M-Scope type ML  Mode-selective launch optical system